Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. F and Cl detection limits in secondary ion mass spectrometry measurements of Si and SiO2 samples;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2010-09
2. The design of a radiocarbon muprobe for tracer mapping in biological specimens;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-12
3. Negative Secondary Ion Emission Influenced by Alkali Atoms;physica status solidi (a);1985-10-16