Electron transport studies in SiO2films excited by a pulsed electron beam
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/14/i=8/a=020/pdf
Reference24 articles.
1. 1 µm MOSFET VLSI technology: Part VIII—Radiation effects
2. Electron trapping in electron‐beam irradiated SiO2
3. Electron−hole pair creation energy in SiO2
4. Photoinjection into SiO2: Electron Scattering in the Image Force Potential Well
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