Combined wave based optical analysis and particle based thermal analysis of nanoscale ultrafast target heating of silicon utilizing a near-field scanning optical probe and a femtosecond laser-Reference-Cited by-同舟云学术

Combined wave based optical analysis and particle based thermal analysis of nanoscale ultrafast target heating of silicon utilizing a near-field scanning optical probe and a femtosecond laser

Published:2009-03-20 Issue:7 Volume:42 Page:075502
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Wen Sy-Bor,Greif Ralph

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/42/i=7/a=075502/pdf

Reference17 articles.

1. Nanoscale chemical analysis by tip-enhanced Raman spectroscopy

2. Tip-Enhanced Coherent Anti-Stokes Raman Scattering for Vibrational Nanoimaging

3. Nanoscale Rapid Melting and Crystallization of Semiconductor Thin Films

4. Ablation of thin metal films by short-pulsed lasers coupled through near-field scanning optical microscopy probes

5. Nanometer-Scale Laser Direct-Write Using Near-Field Optics

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