Sputtered lead scandium tantalate thin films: crystallization behaviour during post-deposition annealing-Reference-Cited by-同舟云学术

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Sputtered lead scandium tantalate thin films: crystallization behaviour during post-deposition annealing

Published:2001-10-23 Issue:21 Volume:34 Page:3121-3129
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Huang Z,Donohue P P,Todd M A,Jones J C,Whatmore R W

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/34/i=21/a=304/pdf

Reference29 articles.

1. Pyroelectric devices and materials

2. Lead scandium tantalate for thermal detector applications

3. A TEM study of ordering in the perovskite, Pb(Sc1/2Ta1/2)O3

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1. Phase transformation and growth mechanism of RF sputtered ferroelectric lead scandium tantalate (PbSc _0.5 Ta _0.5 O ₃ ) films;Journal of the American Ceramic Society;2022-12-15

2. Dielectric and ferroelectric properties of (100)-oriented 0.9Pb(Sc 0.5 Ta 0.5 )O 3 -0.1%PbTiO 3 /0.55Pb(Sc 0.5 Ta 0.5 )O 3 -0.45%PbTiO 3 heterostructures;Applied Surface Science;2014-09

3. Pyroelectric Materials for Dielectric Bolometers;Science of Advanced Materials;2011-10-01

4. Effect of different annealing methods on ferroelectric properties of 0.95Pb(Sc0.5Ta0.5)O3–0.05PbTiO3 thin films;Applied Surface Science;2011-05

5. On the deposition mechanisms and the formation of glassy Cu–Zr thin films;Journal of Applied Physics;2010-04-15

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