Interface roughness in surface-sensitive X-ray methods
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/28/i=4A/a=043/pdf
Reference37 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
3. The profile of layered materials reflected by glancing-incidence X-ray analysis
4. X-ray and neutron reflectivity analysis of thin films and superlattices
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