Phase determination from a focal series and the corresponding diffraction pattern in electron microscopy for strongly scattering objects-Reference-Cited by-同舟云学术

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Phase determination from a focal series and the corresponding diffraction pattern in electron microscopy for strongly scattering objects

Published:1975-08-21 Issue:12 Volume:8 Page:1372-1386
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Schiske P

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/8/i=12/a=009/pdf

Reference16 articles.

1. Notizen: Einseitenband-Holographie

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The phase problem in electron microscopy;Advances in Imaging and Electron Physics;2023

2. Notes and References;Principles of Electron Optics, Volume 4;2022

3. References;Advances in Imaging and Electron Physics;2020

4. Alternative data for the phase determination;Advances in Imaging and Electron Physics;2020

5. Quantitative phase microscopy via optimized inversion of the phase optical transfer function;Applied Optics;2015-10-01

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