Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry-Reference-Cited by-同舟云学术

Calculation of two-dimensional maps of diffuse scattering by a real crystal with microdefects and comparison of results obtained from three-crystal diffractometry

Published:2001-05-03 Issue:10A Volume:34 Page:A87-A92
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Klad`ko V P,Datsenko L I,Bak-Misiuk J,Olikhovskii S I,Machulin V F,Prokopenko I V,Molodkin V B,Maksimenko Z V

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/34/i=10A/a=318/pdf

Reference16 articles.

1. X-ray studies of defect clusters in copper

2. Diffuse X-ray scattering from neutron-irradiated silicon doped with boron

3. Investigation of Interstitials in Electron-Irradiated Aluminum by Diffuse-X-Ray Scattering Experiments

4. On Determination of the Double-Force Tensor of Point Defects in Cubic Crystals by Diffuse X-Ray Scattering

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