Angular variations of electron beam depth-dose functions as deduced from cathodoluminescence measurements in thin films-Reference-Cited by-同舟云学术

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Angular variations of electron beam depth-dose functions as deduced from cathodoluminescence measurements in thin films

Published:1979-10-14 Issue:10 Volume:12 Page:1753-1760
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Hawkes J F B,McCulloch D,Ashton L J

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/12/i=10/a=017/pdf

Reference15 articles.

1. Backscattering of 10-100 keV electrons from thick targets

2. Saturation and Voltage Effects in Cathodoluminescence

3. Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials

4. Surface recombination and diffusion processes in cathodoluminescence and electron bombardment induced conductivity

5. Cathodoluminescence in thin willemite films

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application of a scanning electron microscope in simulating a beta-emission-induced current;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2013-01

2. Cathodoluminescence in thin zinc sulphide films;Journal of Physics D: Applied Physics;1986-07-14

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