Characterization of quaternary CuGa1-xInxTe2thin films deposited by thermal evaporation-Reference-Cited by-同舟云学术

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Characterization of quaternary CuGa1-xInxTe2thin films deposited by thermal evaporation

Published:1995-06-14 Issue:6 Volume:28 Page:1162-1168
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Diaz R,Merino J M,Rueda F,Leon M

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/28/i=6/a=020/pdf

Reference29 articles.

1. Optical properties and grain boundary effects in CuInSe2

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cu(In,Ga)Te2 film growth by a two-stage technique utilizing rapid thermal processing;Semiconductor Science and Technology;2019-02-06

2. Development of smooth CuInGa precursor films for CuIn1−xGaxSe2 thin film solar cell applications;Thin Solid Films;2011-07

3. Thermal expansion and thermal conductivity of CuGa1−x InxTe2 solid solutions;Technical Physics;2003-05

4. Effect of deposition temperature on the optical and structural properties of as-deposited CuInS2films;Semiconductor Science and Technology;2000-03-08

5. Negative-differential-resistance effects in amorphous CuInS2 thin film;Journal of Materials Science: Materials in Electronics;1999

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