Author:
Holst B,Huntley J M,Balsod R,Allison W
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
6 articles.
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1. Neutral helium atom microscopy;Ultramicroscopy;2023-09
2. Finite element analysis of adaptive atom-optical mirrors;Journal of Physics D: Applied Physics;2011-04-19
3. Accurate surface profilometry of ultrathin wafers;Semiconductor Science and Technology;2007-08-06
4. Phase-stepping optical profilometry of atom mirrors;Journal of Physics D: Applied Physics;2003-07-17
5. Construction of a high-resolution moiré interferometer for investigating microstructural displacement fields in materials;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2002-05-15