Comparison of sensitivities of Moiré deflectometry and interferometry to measure electron densities inz-pinch plasmas
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/40/i=7/a=026/pdf
Reference27 articles.
1. Enhanced stability and neutron production in a denseZ-pinch plasma formed from a frozen deuterium fiber
2. A VUV Recombination Radiation Experiment in a Fast Dynamic Z-Pinch
3. Measurement of Laser-Plasma Electron Density with a Soft X-ray Laser Deflectometer
4. Electron Density Measurements of High Density Plasmas Using Soft X-Ray Laser Interferometry
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2. Phase imaging of irradiated foils at the OMEGA EP facility using phase-stepping X-ray Talbot–Lau deflectometry;High Power Laser Science and Engineering;2023
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