A simple method of thin film analysis in the electron probe microanalyser
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/6/i=9/a=318/pdf
Reference6 articles.
1. Electron scattering in thick targets
2. The absorption and atomic number corrections in electron-probe X-ray microanalysis
3. Quantitative Microprobe Analysis of Thin Insulating Films
4. The angular distribution of characteristic x radiation and its origin within a solid target
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