Growth mode and texture study in vanadium dioxide thin films deposited by magnetron sputtering-Reference-Cited by-同舟云学术

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Growth mode and texture study in vanadium dioxide thin films deposited by magnetron sputtering

Published:2008-02-08 Issue:5 Volume:41 Page:055303
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Wei Xiong-Bang,Wu Zhi-Ming,Xu Xiang-Dong,Tao-Wang ,Tang Jing-Jing,Li Wei-Zhi,Jiang Ya-Dong

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/41/i=5/a=055303/pdf

Reference22 articles.

1. Accurate X-ray determination of the lattice parameters and the thermal expansion coefficients of VO2near the transition temperature

2. XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface

3. Vanadium oxide surface studies

4. Mechanisms for Metal-Nonmental Transitions in Transition-Metal Oxides and Sulfides

5. RF sputtered electrochromic V2O5 films

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1. Effect of Ar pressure on phase transition characteristics and charge transport mechanism in VO₂ films grown by RF sputtering of V₂O₅;Physica Scripta;2024-04-10

2. Effects of Film Thickness on the Residual Stress of Vanadium Dioxide Thin Films Grown by Magnetron Sputtering;Materials;2023-07-19

3. The Optical Properties of V₂O₅ Films Deposited on Single Crystal Diamond Under Homogenizing Preparation Technology;Integrated Ferroelectrics;2023-05-22

4. Measurement of Mechanical Properties of VO2 Films by Nanoindentation;Nanomaterials;2023-03-14

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