Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy-Reference-Cited by-同舟云学术

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Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy

Published:1999-01-01 Issue:10A Volume:32 Page:A220-A223
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Jergel M,Mikulík P,Majková E,Luby S,Senderák R,Pincík E,Brunel M,Hudek P,Kostic I,Konecníková A

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/32/i=10A/a=343/pdf

Reference11 articles.

1. X-ray diffraction from laterally structured surfaces: Total external reflection

2. Radiation resistivity of large CeF3 crystals

3. X-ray reflection by multilayer surface gratings

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