Understanding current transport at the Ni/GaN interface using low-frequency noise spectroscopy
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/49/i=47/a=47LT01/pdf
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1. GaN Technology for Power Electronic Applications: A Review
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