Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal-Reference-Cited by-同舟云学术

Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal

Published:1997-10-07 Issue:19 Volume:30 Page:2656-2662
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Glorieux C,Schrijver P De,Thoen J

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/30/i=19/a=002/pdf

Reference31 articles.

1. Surface‐induced ordering of a liquid crystal in the isotropic phase. II. 4‐methoxybenzylidene‐4′‐n‐butylaniline (MBBA)

2. Boundary-layer phase transition in nematic liquid crystals

3. Light-scattering and ellipsometry studies of the two-dimensional smectic-Cto smectic-Atransition in thin liquid-crystal films

4. A study of Si implanted with oxygen using spectroscopic ellipsometry

5. Damage analysis and optical properties of Ge‐implanted silicon

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