The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers-Reference-Cited by-同舟云学术

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The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers

Published:2005-05-06 Issue:10A Volume:38 Page:A190-A194
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Pym A T G,Rozatian A S H,Marrows C H,Brown S D,Bouchenoire L,Hase T P A,Tanner B K

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/38/i=10A/a=036/pdf

Reference10 articles.

1. Magnetic properties and structure of Pd/Co and Pd/Fe multilayers

2. Magnetic surface anisotropy of cobalt and surface roughness effects within Neel's model

3. Dipolar magnetic surface anisotropy in ferromagnetic thin films with interfacial roughness

4. Evidence for grading at polished surfaces from grazing-incidence X-ray scattering

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing;Journal of Applied Physics;2010-05

2. ANISOTROPY AND STRUCTURAL CHARACTERIZATION OF Co/Pd MULTILAYER THIN FILMS;Advances in Synchrotron Radiation;2008-12

3. Interface sharpening and broadening during annealing ofCu∕Nimultilayers: A kinetic Monte Carlo study;Physical Review B;2006-02-02

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