Effects of crystallization conditions on dielectric and ferroelectric properties of PZT thin films
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/36/i=16/a=314/pdf
Reference15 articles.
1. Characterization of Pb(Zr,Ti)O3thin films deposited from multielement metal targets
2. Properties of D.C. magnetron-sputtered lead zirconate titanate thin films
3. Preparation of Pb(Zr,Ti)O3 thin films by sol gel processing: Electrical, optical, and electro‐optic properties
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1. Enhanced dielectric and piezoelectric properties of RF sputtered Pb(Zr0.60,Ti0.40)O3 thin films deposited on sol-gel derived Pb1+x(Zr0.40,Ti0.60)O3 seed layer with various lead contents;Journal of Alloys and Compounds;2019-10
2. Polarization-Control of the Potential Barrier at the Electrode Interfaces in Epitaxial Ferroelectric Thin Films;ACS Applied Materials & Interfaces;2014-01-29
3. Phase transition and electrical properties of highly [1 1 1]-oriented and niobium-modified Pb(ZrxTi1−x)O3thin films with different Zr/Ti ratios;Journal of Physics D: Applied Physics;2008-10-30
4. Patterning of PLZT and PSZT thin films by excimer laser;Applied Physics A;2008-04-19
5. UV Laser Ablation of PLZT and PSZT Films;MRS Proceedings;2008
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