Universal correction procedure for electron-probe microanalysis. IV. The tilt factor
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/20/i=12/a=003/pdf
Reference13 articles.
1. A Monte Carlo calculation on the scattering of electrons in copper
2. The absorption and atomic number corrections in electron-probe X-ray microanalysis
3. The angular distribution of characteristic x radiation and its origin within a solid target
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