Experimental determination of minority carrier lifetime in solar cells using transient measurements
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/20/i=6/a=012/pdf
Reference13 articles.
1. Effect of junction depth on the performance of a diffused n+p silicon solar cell
2. Theory of back surface field silicon solar cells
3. A generalised approach to lifetime measurement in pn junction solar cells
4. Theoretical investigations of experimentally-observed Open-Circuit Voltage-Decay (OCVD) curves
5. Solar cell minority carrier lifetime using open-circuit voltage decay
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1. Influence of the Magnetic Field on the Transient Decay of the Density of Charge Carriers in a Silicon Photocell with Vertical Multijunctions Connected in Series Placed in Open Circuit;Energy and Power Engineering;2022
2. Régimes transitoires des photopiles : durée de vie des porteurs et vitesse de recombinaison;Journal de Physique III;1992-12
3. Determination of lifetime and surface recombination velocity in solar cells;Solar Cells;1991-06
4. The modeling of multi-layer structures and the impact of emitter-base coupling on the determination of base recombination parameters;Solid-State Electronics;1990-09
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