Measurement of thickness and refractive index using femtosecond and terahertz pulses
Author:
Publisher
IOP Publishing
Subject
Physics and Astronomy (miscellaneous),Instrumentation
Link
http://stacks.iop.org/1612-202X/10/i=5/a=055301/pdf
Reference18 articles.
1. An Improved Recording Refractometer for Optical Glasses in the Wavelength Range 300 to 2600 nm
2. Optical coherence refractometry
3. Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics
4. Use of Michelson and Fabry–Perot interferometry for independent determination of the refractive index and physical thickness of wafers
5. Measurement of transparent plates with wavelength-tuned phase-shifting interferometry
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