The use of surface properties for determining semiconductor band gaps
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/9/i=9/a=022/pdf
Reference7 articles.
1. Electroreflection spectra with low modulation intensity
2. Third-derivative modulation spectroscopy with low-field electroreflectance
3. Temperature dependence of the band gap and comparison with the threshold frequency of pure GaAs lasers
4. V. Contact electricity of metals
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