Automatic measurement of nanosecond random time-lags
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/1/i=12/a=320/pdf
Reference10 articles.
1. Breakdown time lags in a dielectric liquid
2. Nanosecond breakdown time lags in a dielectric liquid
3. Modern multi-channel time analyzers in the nanosecond range
4. Automatic measurement of the electric strength of liquid dielectrics
5. Electric Breakdown in n-Hexane
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A high voltage source with digital control for dielectric measurements;Journal of Physics E: Scientific Instruments;1972-06
2. Dependence of the statistical breakdown time-lag of a liquid dielectric on electrode geometry;Journal of Physics D: Applied Physics;1971-02-01
3. Apparent charge mobility from breakdown times in a dielectric liquid;Journal of Physics D: Applied Physics;1970-02-01
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