Relationship between the correction factor of the four-point probe value and the selection of potential and current electrodes
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/2/i=2/a=312/pdf
Reference7 articles.
1. Method for Hall Mobility and Resistivity Measurements on Thin Layers
2. Empirical method of calibrating a 4-point microarray for measuring thin-film-sheet resistance
3. Measurement of Sheet Resistivities with the Four-Point Probe
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