A vacuum ultraviolet scanning reflectometer designed to minimize alignment errors-Reference-Cited by-同舟云学术

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A vacuum ultraviolet scanning reflectometer designed to minimize alignment errors

Published:1970-08 Issue:8 Volume:3 Page:633-635
ISSN:0022-3735
Container-title:Journal of Physics E: Scientific Instruments
language:
Short-container-title:J. Phys. E: Sci. Instrum.

Author:

Draper J C,Murphy E

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Link

http://stacks.iop.org/0022-3735/3/i=8/a=311/pdf

Reference8 articles.

1. Reflectance-Increasing Coatings for the Vacuum Ultraviolet and Their Applications*

2. Ultrahigh Vacuum Reflectometer for Use with Extreme Ultraviolet Synchrotron Radiation

3. Errors in using the Reflectance vs Angle of Incidence Method for Measuring Optical Constants*

4. On the Cause of Errors in Reflectance vs Angle of Incidence Measurements and the Design of Reflectometers to Eliminate the Errors

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. REFLECTOMETERS;Vacuum Ultraviolet Spectroscopy;2000

2. 10. Reflectometers;Experimental Methods in the Physical Sciences;1998

3. The optical properties of mica in the vacuum ultraviolet;Journal of Physics C: Solid State Physics;1972-04-27

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