High-resolution multifold path interferometers for dilatometric measurements
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/16/i=12/a=022/pdf
Reference5 articles.
1. An absolute interferometric dilatometer
2. Measurement of the linear thermal expansion coefficient of thin specimens
3. Stable Multiple-Path Interferometers
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Performance of dilatometer for determining absolute CTE of EUVL LTEMs;Microelectronic Engineering;2006-04
2. High-precision (<1ppb/°C) optical heterodyne interferometric dilatometer for determining absolute CTE of EUVL materials;SPIE Proceedings;2006-03-10
3. Real‐time, high‐resolution optical beam position‐sensing device;Review of Scientific Instruments;1991-01
4. Measurement of thermal expansivity of low-expansion glasses by interferometric methods: Results of an interlaboratory comparison;International Journal of Thermophysics;1990-09
5. Speckle interferometer for thermal expansion measurements;Review of Scientific Instruments;1987-01
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