The attainment of a substrate temperature of 25K in a Philips FM 300 electron microscope-Reference-Cited by-同舟云学术

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The attainment of a substrate temperature of 25K in a Philips FM 300 electron microscope

Published:1982-06 Issue:6 Volume:15 Page:629-631
ISSN:0022-3735
Container-title:Journal of Physics E: Scientific Instruments
language:
Short-container-title:J. Phys. E: Sci. Instrum.

Author:

Curzon A E,Scholz G A,Singh O,Frindt R F

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Link

http://stacks.iop.org/0022-3735/15/i=6/a=006/pdf

Reference4 articles.

1. A liquid helium stage for the Philips EM 300 electron microscope

2. Electron diffraction from thin films of solidified gases

3. Electron diffraction studies on solid α-nitrogen

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Side-Entry Helium-Cooled Stage for Electron Microscopy;Japanese Journal of Applied Physics;1991-02-15

2. An electron diffraction study of the ordering of silver in AgxNbSe2 for 0 0.33;physica status solidi (a);1985-01-16

3. X-ray and electron microscopy studies of single-layer TaS2 and NbS2;Thin Solid Films;1984-03

4. Charge-density waves in the quasi-one-dimensional compounds NbTe4and TaTe4;Journal of Physics C: Solid State Physics;1983-02-28

5. Charge density wave commensurability in 2H-TaS2 and AgxTaS2;Solid State Communications;1982-12

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