An automatic system for low temperature electrical measurements on semiconductors

Author:

Blood P,Headon R F

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Computer automated charge transport measurement system;IEEE Transactions on Instrumentation and Measurement;1988-03

2. Measurement of concentration and photoionization cross section of indium in silicon;Journal of Applied Physics;1983-07

3. Automated, high resistivity Hall effect and photoelectronic apparatus;Journal of Physics E: Scientific Instruments;1981-04

4. Variable range hopping conductivity in reduced lead glass;Applied Physics Letters;1980-08

5. The electrical characterisation of semiconductors;Reports on Progress in Physics;1978-02-01

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