Simple method for simultaneous measurement of work function changes and electron reflectivity variation
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/17/i=12/a=015/pdf
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1. The Contact Difference of Potential Between Tungsten and Barium. The External Work Function of Barium
2. On the annealing behaviour of dysprosium ion implanted nickel: A combined study using Rutherford backscattering, transmission electron microscopy, and total current spectroscopy
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2. The study of epitaxial growth of thin Cu and Ag layers on Ag(110) and Cu(110) using total current spectroscopy, AES and work function measurement;Vacuum;1995-02
3. Investigations of thin Ag and Cu layers epitaxially grown on Cu(111) and Ag(111) by means of TCS, AES and ΔΦ;Vacuum;1994-02
4. A proposal for an electron energy spectrometer based on two simulated hemispherical analysers in tandem for TCS, EELS and SEE;Vacuum;1994-02
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