Apparatus for x-ray measurements on reactive materials at 2500$deg$C-Reference-Cited by-同舟云学术

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Apparatus for x-ray measurements on reactive materials at 2500$deg$C

Published:1969-09 Issue:9 Volume:2 Page:807-809
ISSN:0022-3735
Container-title:Journal of Physics E: Scientific Instruments
language:
Short-container-title:J. Phys. E: Sci. Instrum.

Author:

Harper E A

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation

Link

http://stacks.iop.org/0022-3735/2/i=9/a=313/pdf

Reference12 articles.

1. A high temperature X-ray diffractometer for operation up to 2500 C

2. Adaptation of a Geiger‐Counter X‐Ray Diffractometer for High‐Temperature Investigations

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A high-temperature attachment for precise measurement of lattice parameters by Bond's method between room temperature and 1500K;Journal of Physics E: Scientific Instruments;1982-10

2. High-temperature x-ray equipment for the study of powder and dense objects;Soviet Powder Metallurgy and Metal Ceramics;1970-05

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