Rapid repetitive scanning of impurity spectral line profiles in the VUV for Doppler temperature measurements in the TFR Tokamak
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/13/i=2/a=023/pdf
Reference14 articles.
1. Doppler-Broadening Measurements of X-Ray Lines for Determination of the Ion Temperature in Tokamak Plasmas
2. Vacuum ultraviolet spectroscopic apparatus for space- and time-resolved measurements on a single Tokamak plasma discharge
3. Composition Product Simulator
4. Diagnostic forbidden lines of highly ionized elements for tokamak plasmas
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spectroscopic measurements of tokamak plasma ion temperature using Doppler broadening of impurity lines: Correction for chordal line‐of‐sight observations;Journal of Applied Physics;1991-02-15
2. Near-VUV Doppler monochromator using a multi-anode microchannel plate detector;Journal of Physics E: Scientific Instruments;1987-06
3. High spectral resolution, photon counting detector for Doppler temperature measurements in magnetically confined plasmas;Review of Scientific Instruments;1987-04
4. An increased understanding of gas recycling in tokamaks by mass spectrometry; principle and application in TFR;Journal of Nuclear Materials;1985-01
5. Spectroscopic Plasma Diagnostics;Atomic and Molecular Physics of Controlled Thermonuclear Fusion;1983
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