Comparison of the single reflection and total reflection TDS techniques
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/17/i=6/a=018/pdf
Reference11 articles.
1. Evaluation of dielectric behavior by time domain spectroscopy. 3. Precision difference methods
2. Electrical properties of lens material at microwave frequencies
3. An on-line computer-based system for performing time domain spectroscopy. II. Analysis of the errors in total reflection TDS
4. An on-line computer-based system for performing time domain spectroscopy. I. Main features of the basic system
5. A computer controlled dielectric time domain spectrometer
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2. Dielectric measurements by utilizing the curvature of pulses;IEEE Transactions on Instrumentation and Measurement;1991-06
3. Precision Microwave Complex Permittivity Measurements of High Loss Liquids;Journal of Electromagnetic Waves and Applications;1990-01-01
4. A simple flowthrough cell for microwave dielectric measurements;Journal of Physics E: Scientific Instruments;1989-04
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