Spectrophotometric studies of ultra low loss optical glasses lll: ellipsometric determination of surface reflectances
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/2/i=7/a=306/pdf
Reference11 articles.
1. An Investigation of the Optical Properties and the Growth of Oxide Films on Silicon
2. Spectrophotometric studies of ultra low loss optical glasses II: double beam method
3. Spectrophotometric studies of ultra low loss optical glasses I: single beam method
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Taking account of the optical characteristics of a surface layer in determining the reflection and transmission coefficients of transparent dielectrics;Journal of Applied Spectroscopy;1987-02
2. Measurement of attenuation in low-loss optical glass;Opto-electronics;1971-08
3. Absorption and Scattering Losses in Glasses and Fibers for Light Guidance;Journal of the American Ceramic Society;1971-04
4. Loss Mechanisms and Measurements in Clad Glass Fibers and Bulk Glass;Journal of the Optical Society of America;1971-02-01
5. Spectrophotometric studies of ultra low loss optical glasses II: double beam method;Journal of Physics E: Scientific Instruments;1969-04
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