Glitches compensation in EXAFS data collection
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/16/i=1/a=016/pdf
Reference5 articles.
1. Extended x-ray absorption fine structure—its strengths and limitations as a structural tool
2. Thickness effect on the extended-x-ray-absorption-fine-structure amplitude
3. Suppression of glitches in X-ray measurements
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1. Monitoring the Sodiation Mechanism of Anatase TiO2 Nanoparticle-Based Electrodes for Sodium-Ion Batteries by Operando XANES Measurements;ACS Applied Energy Materials;2020-12-22
2. Rotation of X-ray polarization in the glitches of a silicon crystal monochromator;Journal of Applied Crystallography;2016-07-06
3. Heavy Metal–Mineral Associations in Coeur d’Alene River Sediments: A Synchrotron-Based Analysis;Water, Air, and Soil Pollution;2008-12-16
4. Monochromator-induced glitches in EXAFS data I. Test of the model for linearly tapered samples;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1992-09
5. EXAFS spectroscopy: a new method for structural investigation;Uspekhi Fizicheskih Nauk;1986
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