An imaging atom probe using a single time-gated channel plate
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/11/i=1/a=012/pdf
Reference11 articles.
1. Techniques for field-ion microscopy of copper, gold and aluminium
2. The Atom‐Probe Field Ion Microscope
3. The crystallographic distribution of field-desorbed species
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1. APFIM Characterization of Grain Boundary Segregation in Titanium Carbide-Doped Molybdenum;Le Journal de Physique IV;1996-09
2. Microanalysis of Welds Using Field Ion Microscope/Atom Probe;Polymer-Plastics Technology and Engineering;1994-11
3. Surface analysis with a position-sensitive atom probe;Journal of Physics: Condensed Matter;1989-10-01
4. Materials analysis with a position-sensitive atom probe;Journal of Microscopy;1989-06
5. Application of a position‐sensitive detector to atom probe microanalysis;Review of Scientific Instruments;1988-06
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