A Josephson built-in self-testing (JBIST) system for gigahertz functional tests of Josephson RAMs
-
Published:1996-04-01
Issue:4A
Volume:9
Page:A50-A54
-
ISSN:0953-2048
-
Container-title:Superconductor Science and Technology
-
language:
-
Short-container-title:Supercond. Sci. Technol.
Author:
Hashimoto Yoshihito,Tahara Shuichi,Nagasawa Shuichi,Numata Hideaki,Kato Chinatsu,Aoyagi Masahiro,Nakagawa Hiroshi,Kurosawa Itaru,Takada Susumu
Subject
Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites