Statistical characterization of voltage-biased SQUIDs with weakly damped junctions-Reference-Cited by-同舟云学术

Statistical characterization of voltage-biased SQUIDs with weakly damped junctions

Published:2013-04-23 Issue:6 Volume:26 Page:065002
ISSN:0953-2048
Container-title:Superconductor Science and Technology
language:
Short-container-title:Supercond. Sci. Technol.

Author:

Liu Chao,Zhang Yi,Mück Michael,Zhang Shulin,Krause Hans-Joachim,Braginski Alex I,Zhang Guofeng,Wang Yongliang,Kong Xiangyan,Xie Xiaoming,Offenhäusser Andreas,Jiang Mianheng

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

Link

http://stacks.iop.org/0953-2048/26/i=6/a=065002/pdf

Reference7 articles.

1. CURRENT‐VOLTAGE CHARACTERISTICS OF JOSEPHSON JUNCTIONS

2. Effect of ac Impedance on dc Voltage‐Current Characteristics of Superconductor Weak‐Link Junctions

3. The SQUID Handbook

4. An insight into voltage-biased superconducting quantum interference devices

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