Growth and characterization of Ca doped Eu-123 whiskers for intrinsic Josephson junction applications-Reference-Cited by-同舟云学术

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Growth and characterization of Ca doped Eu-123 whiskers for intrinsic Josephson junction applications

Published:2006-02-07 Issue:4 Volume:19 Page:290-293
ISSN:0953-2048
Container-title:Superconductor Science and Technology
language:
Short-container-title:Supercond. Sci. Technol.

Author:

Islam A T M N,Kawae T,Tachiki Y,Watauchi S,Takano Y,Hatano T,Yamashita T,Tanaka I

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

Reference15 articles.

1. Submicron stacked-junction fabrication from Bi2Sr2CaCu2O8+δ whiskers by focused-ion-beam etching

2. Fabrication of submicron BSCCO stacked junctions by focused ion beam (FIB)

3. Sub-micron sized intrinsic Josephson junctions in YBa2Cu3O7−Xwhiskers

4. Intrinsic Josephson junctions in Y1Ba2Cu3Ox single-crystal whiskers grown using Te-doped precursors

5. Intrinsic Josephson junctions of Tl2Ba2CaCu2Ox thin films for high frequency devices

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Selective Growth and Micropatterning Technique for Oxide Thin Films by Sacrificial a-CaO Layer;ECS Journal of Solid State Science and Technology;2021-08-01

2. Fabrication and characterization of intrinsic Josephson junctions in RE-123 whiskers;Physica C: Superconductivity;2008-09

3. Measurements of the switching current distribution in REBa2Cu3Oy(RE = Eu, Er) intrinsic Josephson junctions;Journal of Physics: Conference Series;2008-03-01

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