A ring circuit for the determination of dynamic error rates in high-temperature superconductor RSFQ circuits
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites
Reference20 articles.
1. RSFQ logic/memory family: a new Josephson-junction technology for sub-terahertz-clock-frequency digital systems
2. Design of SFQ-counting analog-to-digital converter
3. Voltage divider based on submicron slits in a high Tc superconducting film and two bicrystal grain boundaries
4. A single flux quantum shift register operating at 65 K
5. Multilayer HTS SFQ analog-to-digital converters
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Terahertz surface resistance of high temperature superconducting thin films;Journal of Applied Physics;2000-03-15
2. Measurement of the error rate of single flux quantum circuits with high temperature superconductors;IEEE Transactions on Appiled Superconductivity;1999-06
3. Measurement of the dynamic error rate of a high temperature superconductor rapid single flux quantum comparator;Applied Physics Letters;1998-05-04
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