Non-relaxational critical current density measurement of epitaxial thin films by using an improved a.c. magnetization-Reference-Cited by-同舟云学术

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Non-relaxational critical current density measurement of epitaxial thin films by using an improved a.c. magnetization

Published:1997-12-01 Issue:12 Volume:10 Page:955-958
ISSN:0953-2048
Container-title:Superconductor Science and Technology
language:
Short-container-title:Supercond. Sci. Technol.

Author:

Ji Z M,Zhou J,Zuo J P,Zhou G D,Yang S Z,Cheng Q H,Wu P H,Jin X

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

Reference14 articles.

1. Method for making low‐resistivity contacts to highTcsuperconductors

2. Magnetization of Hard Superconductors

3. Critical‐current measurements of high‐Tc superconductors using a transformer technique

4. Critical state in high Tc superconductors: magnetization and creep of the intergranular region

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Point Contact Based Method to Measure Critical Current Density of Superconductor Bulk;Physics Procedia;2012

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