Structural strain ina-axis oriented thin films studied by electron backscatter diffraction-Reference-Cited by-同舟云学术

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Structural strain ina-axis oriented thin films studied by electron backscatter diffraction

Published:1998-03-01 Issue:3 Volume:11 Page:278-283
ISSN:0953-2048
Container-title:Superconductor Science and Technology
language:
Short-container-title:Supercond. Sci. Technol.

Author:

Gao J,Cheng T L

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

Reference17 articles.

1. Surface study ofa,b‐axis oriented YBa2Cu3O7−δepitaxial thin films byinsituangle resolved x‐ray photoemission spectroscopy

2. Superconductivity of epitaxially grown α-axis YBCO films on SrTiO3 substrate

3. Effects of target and template layer on the properties of highly crystalline superconducting a-axis films of Y1Ba2Cu3O7−x by DC-sputtering

4. Epitaxial and Smooth Films of a -Axis YBa 2 Cu 3 O 7

5. Crystallinity ofa‐axis oriented YBa2Cu3O7−δthin film epitaxially grown on NdGaO3(110) by 95 MHz magnetron sputtering

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Preparation of highly crystallinea-axis-oriented YBa2Cu3O7-δsuperconducting films by a self-template technique;Superconductor Science and Technology;2001-04-12

2. I-V properties of heterostructures of superconductor ferroelectric junction;Fourth International Conference on Thin Film Physics and Applications;2000-11-29

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