Characterization of polycrystalline gradient thin film by X-ray diffraction method
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1009-1963/9/4/007/pdf
Reference14 articles.
1. X‐Ray Diffraction from a Binary Diffusion Zone
2. Strain distribution in thin aluminum films using x‐ray depth profiling
3. X-ray phase analysis with depth profiling for thin films
4. Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction
5. Depth Profiling of Ceramic Specimens using Multi-Wavelength X-Ray Bragg-Brentano Diffraction Data with Particular Reference to Zirconia-Aluminas
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The direct determination of X-ray diffraction data from specific depths;Powder Diffraction;2005-09
2. Determination of depth-dependent diffraction data: a new approach;Acta Crystallographica Section A Foundations of Crystallography;2004-12-22
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