Abstract
Abstract
In this study, we evaluate the variation of the work function of phosphorene during thermal oxidation at different temperatures. The ultraviolet photoelectron spectroscopy results show an N-shaped behaviour that is explained by the oxidation process and the dangling-to-interstitial conversion at elevated temperatures. The exfoliation degree and x-ray photoelectron spectroscopy confirm the formation of native oxides in the top-most layer that passivates the material. Ex-situ XPS reveals the full oxidation of monolayers at temperatures higher than 140 °C, but few-layer phosphorene withstands the thermal oxidation even up to 200 °C with slight modifications of the A
2
g/A
1
g and A
2
g/B
2g vibrational mode ratios and a weak fluorescence in the Raman spectra of the heat-treated samples.
Funder
Hungarian National Research, Development, and Innovation
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献