Temperature-dependent indirect gaps for two-dimensional bismuth oxychalcogenides probed by spectroscopic ellipsometry

Author:

Liu Hsiang-LinORCID,Chen Hsiao-Wen,Tuan Hung NguyenORCID,Chen Yi-Cheng,Liu Heng-Jui,Chen Chieh-Ting,Chueh Yu-LunORCID,Chu Ying-HaoORCID,Saito RiichiroORCID

Abstract

Abstract In-plane optical properties of two-dimensional bismuth oxychalcogenides Bi2O2X (X = S, Se, and Te) are reported for a wide spectral range of 0.73–6.42 eV and at temperatures of 4.5–500 K by spectroscopic ellipsometry. At room temperature, Bi2O2S, Bi2O2Se, and Bi2O2Te exhibit an indirect band gap of 1.18 ± 0.02, 0.95 ± 0.01, and 0.60 ± 0.01 eV, respectively. As the temperature decreases, the indirect absorption edge of Bi2O2S undergoes a blueshift, while the indirect band gap of Bi2O2Se shows a redshift, and Bi2O2Te remains independent of temperature. The chalcogenide-dependent behavior as a function of temperature may be relevant to electron–phonon interactions in Bi2O2X materials. The observed pseudo-isotropic complex dielectric function and optical absorption coefficient by spectroscopic ellipsometry are directly compared with the first-principles calculations with a hybrid functional approach.

Funder

Ministry of Education (MOE), Taiwan

National Science and Technology Council

National Science and Technology Council, Taiwan

the Frontier Research Institute for Interdisciplinary Sciences, Tohoku University

Publisher

IOP Publishing

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