Multiwavelength excitation Raman scattering analysis of bulk and two-dimensional MoS 2 : vibrational properties of atomically thin MoS 2 layers-Reference-Cited by-同舟云学术

Multiwavelength excitation Raman scattering analysis of bulk and two-dimensional MoS 2 : vibrational properties of atomically thin MoS 2 layers

Published:2015-07-07 Issue:3 Volume:2 Page:035006
ISSN:2053-1583
Container-title:2D Materials
language:
Short-container-title:2D Mater.

Author:

Placidi Marcel,Dimitrievska Mirjana,Izquierdo-Roca Victor,Fontané Xavier,Castellanos-Gomez Andres,Pérez-Tomás Amador,Mestres Narcis,Espindola-Rodriguez Moises,López-Marino Simon,Neuschitzer Markus,Bermudez Veronica,Yaremko Anatoliy,Pérez-Rodríguez Alejandro

Publisher

IOP Publishing

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://iopscience.iop.org/article/10.1088/2053-1583/2/3/035006/pdf

Reference42 articles.

1. Electronics and optoelectronics of two-dimensional transition metal dichalcogenides

2. Single-layer MoS2 transistors

3. Graphene-Like Two-Dimensional Materials

4. Integrated Circuits and Logic Operations Based on Single-Layer MoS2

5. Integrated Circuits Based on Bilayer MoS2 Transistors

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