Fragmentation patterns of ionized C5Q+clusters (Q= 1 → 4)-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Fragmentation patterns of ionized C5Q+clusters (Q= 1 → 4)

Published:1997-01-01 Issue: Volume:T73 Page:282-283
ISSN:0031-8949
Container-title:Physica Scripta
language:
Short-container-title:Phys. Scr.

Author:

Chabot M,Wohrer K,Rozet J P,Gardès D,Vernhet D,Jacquet D,Negra S Della,Brunelle A,Nectoux M,Pautrat M,Beyec Y Le

Publisher

IOP Publishing

Subject

Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics

Link

http://stacks.iop.org/1402-4896/1997/i=T73/a=092/pdf

Reference9 articles.

1. Stability of multiply-charged cluster and fullerene ions

2. Stability of charged metal clusters

3. Swift cluster-atom collisions: experiment and model calculations

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fully versus constrained statistical fragmentation of carbon clusters and their heteronuclear derivatives;The Journal of Chemical Physics;2019-04-14

2. Unraveling the Metastability of Cn2+ (n = 2–4) Clusters;The Journal of Physical Chemistry Letters;2019-01-23

3. Sublinear and superlinear dependences of average charge and energy loss per ion on particle number for MeV/atom linear-chained carbon-cluster ions traversing a carbon foil;Physical Review A;2012-07-16

4. Average charge and its structure dependence of fragment ions under irradiation of a thin carbon foil with a1−MeV/atomC3+cluster ion;Physical Review A;2007-12-12

5. Ionization potentials, dissociation energies and statistical fragmentation of neutral and positively charged small carbon clusters;Brazilian Journal of Physics;2006-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3