Determination of the complex dielectric function of Si(111) 2 × 1, GaAs(110) and GaP(110) surfaces by polarized surface differential reflectivity-Reference-Cited by-同舟云学术

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Determination of the complex dielectric function of Si(111) 2 × 1, GaAs(110) and GaP(110) surfaces by polarized surface differential reflectivity

Published:1988-08-01 Issue:2 Volume:38 Page:199-203
ISSN:0031-8949
Container-title:Physica Scripta
language:
Short-container-title:Phys. Scr.

Author:

Cricenti A,Selci S,Ciccacci F,Felici A C,Goletti C,Yong Zhu,Chiarotti G

Publisher

IOP Publishing

Subject

Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics

Link

http://stacks.iop.org/1402-4896/38/i=2/a=017/pdf

Reference15 articles.

1. Optical Absorption of Surface States in Ultrahigh Vacuum Cleaved (111) Surfaces of Ge and Si

2. Differential Reflectivity of Si(111)2×1 Surface with Polarized Light: A Test for Surface Structure

3. Polarization-dependent reflectivity of Si(111)-(2×1) surface above the gap

4. Dielectric properties of the Si(111)2×1 surface: Optical constants and the energy-loss spectrum

5. Surface differential reflectivity spectroscopy of semiconductor surfaces

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