A warm electron beam ion trap: the micro-EBIT
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/1402-4896/1997/i=T71/a=020/pdf
Reference11 articles.
1. Review of the JINR Electron Beam Ion Sources
2. The Electron Beam Ion Trap: A New Instrument for Atomic Physics Measurements
3. A high-energy electron beam ion trap for production of high-charge high-Z ions
4. Observation of theKLLDielectronic Recombination Process in Highly Stripped Argon Ions
5. Measurement of electron-impact–excitation cross sections for very highly charged ions
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