Self-assembled polystyrene nanospheres for the evaluation of atomic force microscopy tip curvature radius
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference19 articles.
1. Atomic Force Microscope
2. Accurate and traceable calibration of two-dimensional gratings
3. Design of an atomic force microscope with interferometric position control
4. Comparison of Different Methods of SFM Tip Shape Determination for Various Characterisation Structures and Types of Tip
5. Aspects of scanning force microscope probes and their effects on dimensional measurement
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