A digital control system for scanning tunnelling microscopy and atomic force microscopy

Author:

Wong T M H,Welland M E

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Open STM: A low-cost scanning tunneling microscope with a fast approach method;HardwareX;2024-03

2. Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe;Micromachines;2023-01-15

3. A scanning tunneling microscope with a scanning range from hundreds of micrometers down to nanometer resolution;Review of Scientific Instruments;2012-10

4. Open source scanning probe microscopy control software package GXSM;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-05

5. In situelectron diffraction characterization of the deformation of nanobelts: Gallium oxide;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2009-07

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